Speaker: Dr. Ephraim Suhir, Portland State University; Life Fellow of the IEEE; EPS Distinguished Lecturer

Meeting Date: Tuesday, August 25, 2020
Time: 8:00 AM (PDT)
Cost: none
Location: on the Internet
Summary: This webinar addresses an evolving philosophy of accelerated testing in electronic and photonic packaging, and could be viewed as a possible extension and modification of Highly Accelerated Life Testing (HALT) for applications where a high level of operational reliability is critical, such as aerospace, military, long-haul communications, self-driving vehicles, or medical. The highly focused and highly cost-effective Failure Oriented Accelerated Testing (FOAT) approach is suggested as a suitable experimental basis for the Probabilistic Design for Reliability (PDfR) concept. The PDfR concept is used to assess a product’s lifetime and the corresponding never-zero probability of failure in the field for the given product and application and make this probability adequate for the given product and application. The general concepts are illustrated by numerical examples.

Bio: Dr. Ephraim Suhir is a member of the Santa Clara Valley Chapter of EPS. He is on the faculty of Portland State University, USA; Technical University, Vienna, Austria; and James Cook University, Australia. He is also a Life Fellow of the IEEE, the American Society of Mechanical Engineers (ASME), the Society of Optical Engineers (SPIE), and the International Microelectronics and Packaging Society (IMAPS) and has over 400+ publications in electronics and reliability engineering. Ephraim is an EPS Distinguished Lecturer.