Meeting Date: November 20-21, 2025
Location: Both in-person (at SEMI, in Milpitas) and online (via WebEx)
Cost: Internet (WebEx) only: $35. In-person: $90 ($75 for IEEE members) through Oct. 30
Both include access to On-Demand videos of most presentations (2 weeks after Symposium)
Accepting proposals for presentations: Download the Call for Presentations
Information and Registration: attend.ieee.org/repp
Summary: This major Silicon Valley symposium will focus on quantified reliability, accelerated testing and probabilistic assessments of the useful lifetime of electronic, photonic, MEMS and MOEMS materials, assemblies, packages and systems in electronics and photonics packaging. This includes failure modes, mechanisms, testing schemes, accelerated testing, stress levels, and environmental stresses.
The intent is to bring together electrical, reliability, materials, mechanical, and computer engineers and applied scientists to address the state-of-the-art in all the interconnected fields of electronic and photonic packaging, with an emphasis on various reliability-related aspects: design-for-reliability, manufacturing, reliability modeling and accelerated testing.