Pre-registration required; Register Here: https://bit.ly/sfbac_gan Speaker  Dr. Sandeep Bahl Abstract: There has been tremendous progress in the industry’s understanding of GaN reliability in the last few years spurred by investments to deploy GaN power devices in IT infrastructure such as server, datacenter power supplies and consumer electronics such as AC/DC adaptors. The gallium nitride (GaN) power industry has invested considerable time and effort on reliability validation, formed a JEDEC committee and published several key guidelines including one on switching reliability. The overarching question today is not "Is GaN reliable?" anymore; but instead it is "How did you validate GaN’s reliability and what is the data?". This talk describes how TI GaN power devices are assured reliable by using a common approach, and shows reliability evaluation and lifetime performance in the context of server, datacenter and telecom power supply operating/mission profiles. About the Speaker: Sandeep Bahl is a Distinguished Member of Technical Staff at Texas Instruments, responsible for the reliability of TI GaN parts. He has hands-on experience on many aspects of technology development, including co-inventing TI’s direct-drive GaN architecture. He is also co-chair of the JEDEC JC70 GaN reliability task group and led the first JEDEC GaN reliability guideline, JEP180. Prior to Texas Instruments, he worked at HP/Agilent. Sandeep graduated with a PhD in Electrical Engineering from the Massachusetts Institute of Technology.