Speakers:
Meeting Date: Wednesday, April 15, 2026
Time: Your choice: 7:00 AM (PDT) or 7:00 PM (PDT)
Cost: none
Reservations: microsanj.com/technical-webinar-april-15-2026
Summary: The transition to 3D heterogeneous integration has fundamentally changed the thermal characterization problem. Buried heat sources, anisotropic thin-film materials, through-silicon vias, and multilayer stacked structures require measurement techniques with sub-micron spatial resolution, depth sensitivity, and a temporal range — capabilities that infrared thermography and Raman spectroscopy cannot reliably deliver at this level of structural complexity. This session presents optical sampling thermoreflectance as a practical, commercially available solution, with real measurement data from a university lab and an industrial FA environment.
What you’ll learn:
• The pump-probe TDTR framework underlying nanosecond and picosecond optical sampling — and when each regime applies
• Full-field megapixel lock-in thermoreflectance for die-level hot spot detection in 3D stacked structures
• Single-point transient analysis for in-plane and cross-plane thermal conductivity extraction in bulk materials, thin films, and multilayer structures
• Measurement results from wide bandgap device characterization — GaN, SiC, and related materials
• Industry failure analysis and reliability workflows where optical sampling replaces destructive physical analysis
• Deployment options, upgrade paths, and testing services for getting started
Bio: Dr. Ali Shakouri, CTO at Microsanj LLC & Professor at Purdue University
Inventor of the optical sampling approach commercialized in the NOSH-TDTR and POSH-TDTR platforms. Ali leads Microsanj’s core technology development and will anchor the technical content of the session.
Bio: Prof. Stefan Dilhaire, University of Bordeaux
Stefan co-presents the technical foundation of the session alongside Ali, bringing deep expertise in optical sampling techniques and their application to thermal characterization of advanced semiconductor structures.
Bio: Prof. Srabanti Chowdhury, Professor of Electrical Engineering, Stanford University
A leading researcher in wide bandgap semiconductor devices, including GaN and diamond. Prof. Chowdhury’s lab has used optical sampling thermoreflectance to characterize thermal properties of novel power device materials where conventional tools cannot provide the required resolution or material sensitivity.
Bio: Doug Gray, Technical Director, Microsanj LLC
With years of direct customer engagement across the Microsanj install base, Doug brings firsthand knowledge of how thermoreflectance systems are applied to real failure analysis and reliability challenges across the semiconductor industry.
